Straightforward bias- and frequency-dependent small-signal model extraction for single-layer graphene FETs.

MLA

Mavredakis, Nikolaos, et al. “Straightforward Bias- and Frequency-Dependent Small-Signal Model Extraction for Single-Layer Graphene FETs.” Microelectronics Journal, vol. 133, Mar. 2023, p. N.PAG. EBSCOhost, https://doi.org/10.1016/j.mejo.2023.105715.

APA

Mavredakis, N., Pacheco-Sanchez, A., Wei, W., Pallecchi, E., Happy, H., & Jiménez, D. (2023). Straightforward bias- and frequency-dependent small-signal model extraction for single-layer graphene FETs. Microelectronics Journal, 133, N.PAG. https://doi.org/10.1016/j.mejo.2023.105715

Chicago

Mavredakis, Nikolaos, Anibal Pacheco-Sanchez, Wei Wei, Emiliano Pallecchi, Henri Happy, and David Jiménez. 2023. “Straightforward Bias- and Frequency-Dependent Small-Signal Model Extraction for Single-Layer Graphene FETs.” Microelectronics Journal 133 (March): N.PAG. doi:10.1016/j.mejo.2023.105715.