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Phase Deflectometry for Defect Detection of High Reflection Objects.
- Source :
-
Sensors (14248220) . Feb2023, Vol. 23 Issue 3, p1607. 11p. - Publication Year :
- 2023
-
Abstract
- A method for detecting the surface defects of high reflection objects using phase deflection is proposed. The abrupt change in the surface gradient at the defect leads to the change in the fringe phase. Therefore, Gray code combined with a four-step phase-shift method was employed to obtain the surface gradients to characterize the defects. Then, through the double surface illumination model, the relationship between illumination intensity and phase was established. The causes of periodic error interference were analyzed, and the method of adjusting the fringe width to eliminate it was proposed. Finally, experimental results showed the effectiveness of the proposed method. [ABSTRACT FROM AUTHOR]
- Subjects :
- *GRAY codes
*SURFACE defects
*PHASE-shifting interferometry
Subjects
Details
- Language :
- English
- ISSN :
- 14248220
- Volume :
- 23
- Issue :
- 3
- Database :
- Academic Search Index
- Journal :
- Sensors (14248220)
- Publication Type :
- Academic Journal
- Accession number :
- 161874504
- Full Text :
- https://doi.org/10.3390/s23031607