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Challenges and opportunities of deep learning-based process fault detection and diagnosis: a review.

Authors :
Yu, Jianbo
Zhang, Yue
Source :
Neural Computing & Applications. Jan2023, Vol. 35 Issue 1, p211-252. 42p.
Publication Year :
2023

Abstract

Process fault detection and diagnosis (FDD) is a predominant task to ensure product quality and process reliability in modern industrial systems. Those traditional FDD techniques are largely based on diagnostic experience. These methods have met significant challenges with immense expansion of plant scale and large numbers of process variables. Recently, deep learning has become the newest trends in process control. The upsurge of deep neural networks (DNNs) in leaning highly discriminative features from complicated process data has provided practitioners with effective process monitoring tools. This paper is to present a review and full developing route of deep learning-based FDD in complex process industries. Firstly, the nature of traditional data projection-based and machine learning-based FDD methods is discussed in process FDD. Secondly, the characteristics of deep learning and their applications in process FDD are illustrated. Thirdly, these typical deep learning techniques, e.g., transfer learning, generative adversarial network, capsule network, graph neural network, are presented for process FDD. These DNNs will effectively solve these problems of fault detection, fault classification, and fault isolation in process. Finally, the developing route of DNN-based process FDD techniques is highlighted for future work. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
09410643
Volume :
35
Issue :
1
Database :
Academic Search Index
Journal :
Neural Computing & Applications
Publication Type :
Academic Journal
Accession number :
161191383
Full Text :
https://doi.org/10.1007/s00521-022-08017-3