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Degradation of nitrobenzene in 3D stack Z-scheme photoelectrocatalytic system: Degradation condition, pathway analysis and synergistic mechanism.
- Source :
-
Process Safety & Environmental Protection: Transactions of the Institution of Chemical Engineers Part B . Jan2023, Vol. 169, p34-47. 14p. - Publication Year :
- 2023
-
Abstract
- As a representative pollutant with carcinogenesis, mutagenicity and teratogenicity, nitrobenzene (NB) has devastating harm to human health. Herein, a unique three-dimensional (3D) stack Z-scheme photoelectrocatalytic (PEC) system was built by self-assembled different photoelectrodes for efficient NB removal. The effect of initial NB, bias potential, pH and electrolyte concentration on NB removal efficiency were investigated. The intermediates and oxygen-active radicals were determined and analyzed by high performance liquid chromatography (HPLC), gas chromatography-mass spectrometry (GC-MS), density functional theory (DFT) and electron paramagnetic resonance (EPR) to propose the NB degradation pathways and mechanism. The results showed that holes were utilized to produce ·OH to oxidize NB on the photoanode surface, the electrons excited from photocathode could reduce NB under UV irradiation; thereafter, the reduction product (aniline) was oxidized to phenol to achieve mineralization by the synergistic effect of anode (oxidation) and cathode (reduction). 3D stack Z-scheme PEC system exhibited a high NB degradation efficiency of 98.18% after 90 min reaction and a mineralization efficiency of 75.08% at 150 min. With ECOSAR software, the system toxicity was speculated. This study has advantages in NB removal and provides direction for other refractory organics. [Display omitted] [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 09575820
- Volume :
- 169
- Database :
- Academic Search Index
- Journal :
- Process Safety & Environmental Protection: Transactions of the Institution of Chemical Engineers Part B
- Publication Type :
- Academic Journal
- Accession number :
- 160982644
- Full Text :
- https://doi.org/10.1016/j.psep.2022.10.075