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Advanced rail clamp networks for ESD protection

Authors :
Stockinger, Michael
Miller, James W.
Khazhinsky, Michael G.
Torres, Cynthia A.
Weldon, James C.
Preble, Bryan D.
Bayer, Martin J.
Akers, Matthew
Kamat, Vishnu G.
Source :
Microelectronics Reliability. Feb2005, Vol. 45 Issue 2, p211-222. 12p.
Publication Year :
2005

Abstract

A new, area efficient, boosted and distributed active MOSFET rail clamp network for I/O pad ESD protection is presented. In addition, a compact new rail clamp trigger circuit with high resistance to false triggering is introduced. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
00262714
Volume :
45
Issue :
2
Database :
Academic Search Index
Journal :
Microelectronics Reliability
Publication Type :
Academic Journal
Accession number :
16093978
Full Text :
https://doi.org/10.1016/j.microrel.2004.05.009