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Overview of metrics applicable in embedded systems functional testing.

Authors :
Kimla, Rafal
Source :
AIP Conference Proceedings. 2022, Vol. 2611 Issue 1, p1-4. 4p.
Publication Year :
2022

Abstract

The black-box approach to embedded systems testing, also known as functional testing, requires a special set of metrics to be gathered in order to evaluate its outcome. This article presents the overview of the most common metrics that can assist in measuring the effectiveness of testing and that can be used to compare the different test methodologies or strategies. [ABSTRACT FROM AUTHOR]

Subjects

Subjects :
*TEST systems

Details

Language :
English
ISSN :
0094243X
Volume :
2611
Issue :
1
Database :
Academic Search Index
Journal :
AIP Conference Proceedings
Publication Type :
Conference
Accession number :
160370781
Full Text :
https://doi.org/10.1063/5.0119761