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Overview of metrics applicable in embedded systems functional testing.
- Source :
-
AIP Conference Proceedings . 2022, Vol. 2611 Issue 1, p1-4. 4p. - Publication Year :
- 2022
-
Abstract
- The black-box approach to embedded systems testing, also known as functional testing, requires a special set of metrics to be gathered in order to evaluate its outcome. This article presents the overview of the most common metrics that can assist in measuring the effectiveness of testing and that can be used to compare the different test methodologies or strategies. [ABSTRACT FROM AUTHOR]
- Subjects :
- *TEST systems
Subjects
Details
- Language :
- English
- ISSN :
- 0094243X
- Volume :
- 2611
- Issue :
- 1
- Database :
- Academic Search Index
- Journal :
- AIP Conference Proceedings
- Publication Type :
- Conference
- Accession number :
- 160370781
- Full Text :
- https://doi.org/10.1063/5.0119761