Back to Search Start Over

A fast decomposition algorithm of positive and negative sequence components with sampling noise optimization.

Authors :
Ma, Mingyao
Liang, Jiacheng
Xiang, Nianwen
Wang, Hanyu
Wu, Jijun
Source :
Microelectronics Reliability. Nov2022, Vol. 138, pN.PAG-N.PAG. 1p.
Publication Year :
2022

Abstract

In this paper, a fast decomposition algorithm of positive and negative sequence components is derived first. And based on analyzing the interaction between sampling noise and time (angle) delay, a sampling-noise-optimized decomposition algorithm is proposed. This optimized method can identify positive and negative sequence components quickly and limit the error caused by sampling noise. Compared with existing methods, the new algorithm has a rapid response speed and greatly reduces the sampling noise level under the same response time. Therefore it is more suitable for those time-critical applications. Simulation results are in correspond with analytical conclusions and the validity of the method is examined. • Noise-optimized fast decomposition method of positive & negative sequence components. • Faster response speed and relatively lower sampling noise level. • A generic algorithm for different time-critical applications. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00262714
Volume :
138
Database :
Academic Search Index
Journal :
Microelectronics Reliability
Publication Type :
Academic Journal
Accession number :
159979534
Full Text :
https://doi.org/10.1016/j.microrel.2022.114709