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Anti-Blooming Clocking for Time-Delay Integration CCDs.
- Source :
-
Sensors (14248220) . Oct2022, Vol. 22 Issue 19, p7520-7520. 11p. - Publication Year :
- 2022
-
Abstract
- This paper presents an investigation of the responsivity of a time-delay integration (TDI) charge-coupled device that employs anti-blooming clocking and uses a varying number of TDI stages. The influence of charge blooming caused by unused TDI stages in a TDI deployed selection scheme is shown experimentally, and an anti-blooming clocking mechanism is analyzed. The impact of blooming on sensor characteristics, such as the responsivity, the conversion gain, and the signal-to-noise ratio, is investigated. A comparison of the measurements with and without this anti-blooming clocking mechanism is presented and discussed in detail. [ABSTRACT FROM AUTHOR]
- Subjects :
- *CLOCKS & watches
*SIGNAL-to-noise ratio
Subjects
Details
- Language :
- English
- ISSN :
- 14248220
- Volume :
- 22
- Issue :
- 19
- Database :
- Academic Search Index
- Journal :
- Sensors (14248220)
- Publication Type :
- Academic Journal
- Accession number :
- 159699598
- Full Text :
- https://doi.org/10.3390/s22197520