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Submicrometer Hall devices fabricated by focused electron-beam-induced deposition.
- Source :
-
Applied Physics Letters . 1/24/2005, Vol. 86 Issue 4, p042503. 3p. 2 Diagrams, 3 Graphs. - Publication Year :
- 2005
-
Abstract
- Hall devices having an active area of about (500 nm)2 are fabricated by focused electron-beam-induced deposition. The deposited material consists of cobalt nanoparticles in a carbonaceous matrix. The realized devices have, at room temperature, a current sensitivity of about 1 V/AT, a resistance of a few kilo-ohms, and can be biased with a maximum current of about 1 mA. The room-temperature magnetic field resolution is about 10 μT/Hz1/2 at frequencies above 1 kHz. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 86
- Issue :
- 4
- Database :
- Academic Search Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 15925550
- Full Text :
- https://doi.org/10.1063/1.1856134