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Submicrometer Hall devices fabricated by focused electron-beam-induced deposition.

Authors :
Boero, G.
Utke, I.
Bret, T.
Quack, N.
Todorova, M.
Mouaziz, S.
Kejik, P.
Brugger, J.
Popovic, R. S.
Hoffmann, P.
Source :
Applied Physics Letters. 1/24/2005, Vol. 86 Issue 4, p042503. 3p. 2 Diagrams, 3 Graphs.
Publication Year :
2005

Abstract

Hall devices having an active area of about (500 nm)2 are fabricated by focused electron-beam-induced deposition. The deposited material consists of cobalt nanoparticles in a carbonaceous matrix. The realized devices have, at room temperature, a current sensitivity of about 1 V/AT, a resistance of a few kilo-ohms, and can be biased with a maximum current of about 1 mA. The room-temperature magnetic field resolution is about 10 μT/Hz1/2 at frequencies above 1 kHz. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00036951
Volume :
86
Issue :
4
Database :
Academic Search Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
15925550
Full Text :
https://doi.org/10.1063/1.1856134