Cite
The Investigation of Electrical Characteristics for Carbon Nano-Tubes as Through Silicon Via in Multi-Layer Stacking Scheme With an Optimized Structure.
MLA
Chen, K. C., et al. “The Investigation of Electrical Characteristics for Carbon Nano-Tubes as Through Silicon Via in Multi-Layer Stacking Scheme With an Optimized Structure.” IEEE Transactions on Electron Devices, vol. 69, no. 9, Sept. 2022, pp. 5386–90. EBSCOhost, https://doi.org/10.1109/TED.2022.3193917.
APA
Chen, K.-C., Basu, N., Chen, S.-C., Lee, M.-H., & Liao, M.-H. (2022). The Investigation of Electrical Characteristics for Carbon Nano-Tubes as Through Silicon Via in Multi-Layer Stacking Scheme With an Optimized Structure. IEEE Transactions on Electron Devices, 69(9), 5386–5390. https://doi.org/10.1109/TED.2022.3193917
Chicago
Chen, K. -C., Nilabh Basu, S. -C. Chen, M. -H. Lee, and M. -H. Liao. 2022. “The Investigation of Electrical Characteristics for Carbon Nano-Tubes as Through Silicon Via in Multi-Layer Stacking Scheme With an Optimized Structure.” IEEE Transactions on Electron Devices 69 (9): 5386–90. doi:10.1109/TED.2022.3193917.