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Stress tests.

Authors :
Galpin, Darren
Source :
Electronics Systems & Software. Dec2004/Jan2005, Vol. 2 Issue 6, p10-15. 6p. 4 Color Photographs, 2 Diagrams.
Publication Year :
2004

Abstract

Discusses the importance of reusable verification components in combination with other techniques to provide a way of stressing the system to reveal bugs other approaches would not find. Significance of building reusable devices for verification to system designs; Devices that provides a reusable way of testing devices with a common functionality or common protocol; Effort of Infineon Technologies to build reusable verification components in the language e that exploit random testing techniques.

Details

Language :
English
ISSN :
14798336
Volume :
2
Issue :
6
Database :
Academic Search Index
Journal :
Electronics Systems & Software
Publication Type :
Academic Journal
Accession number :
15804803