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Stress tests.
- Source :
-
Electronics Systems & Software . Dec2004/Jan2005, Vol. 2 Issue 6, p10-15. 6p. 4 Color Photographs, 2 Diagrams. - Publication Year :
- 2004
-
Abstract
- Discusses the importance of reusable verification components in combination with other techniques to provide a way of stressing the system to reveal bugs other approaches would not find. Significance of building reusable devices for verification to system designs; Devices that provides a reusable way of testing devices with a common functionality or common protocol; Effort of Infineon Technologies to build reusable verification components in the language e that exploit random testing techniques.
Details
- Language :
- English
- ISSN :
- 14798336
- Volume :
- 2
- Issue :
- 6
- Database :
- Academic Search Index
- Journal :
- Electronics Systems & Software
- Publication Type :
- Academic Journal
- Accession number :
- 15804803