Back to Search Start Over

Decomposition Products and Mechanism of C 5 F 10 O/N 2 Gas Mixture by Electron Attachment Mass Spectrometry.

Authors :
Wang, Xiaonan
Yuan, Huan
Yang, Aijun
Liu, Dingxin
Wang, Xiaohua
Rong, Mingzhe
Source :
IEEE Transactions on Dielectrics & Electrical Insulation. Jun2022, Vol. 29 Issue 3, p1127-1134. 8p.
Publication Year :
2022

Abstract

This work aims to detect the discharge products and study the decomposition characteristics of C5F10O/N2 gas mixture under pulsed discharge. Discharge tests are carried out on three kinds of gas mixtures with different contents of C5F10O (3.3%, 10%, and 30%). Electron attachment mass spectrometry (MS) is proposed to detect discharge products after negative ionization, and the results are compared with that in gas chromatography (GC) MS. The discharge products are detected and the formation pathways of the main decomposition products are deduced. The results show that the densities of some products increase with the number of discharge pulses. There are differences on the types of products and the cumulative effect of discharge in the three kinds of gas mixtures. Furthermore, these discharge products are able to characterize the discharge accumulation effects in power switchgear, such as insulation degradation. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
10709878
Volume :
29
Issue :
3
Database :
Academic Search Index
Journal :
IEEE Transactions on Dielectrics & Electrical Insulation
Publication Type :
Academic Journal
Accession number :
157745623
Full Text :
https://doi.org/10.1109/TDEI.2022.3173491