МЕТОДИ ФОРМУВАННЯ ТА КОНТРОЛЮ ПОЛІВ ОПРОМІНЕННЯ МІКРОТРОНА М-30.

The paper describes the accelerator Mikrotron M-30 (1-18 MeV) of the Institute of Electronic Physics of the National Academy of Sciences of Ukraine and its main characteristics. Also, it briefly reviews articles on the formation of radiation fields and discusses their characteristics for nuclear physics installations. It includes application of various methods of measuring the currents of charged particles, methods of detecting radiation Fields using various recording media and changing the spatial distribution using attening lters. Attention is also paid to an alternative low-cost registration method using commercial window glass. For the Mikrotron M-30 accelerator, parameters of the radiation fields were investigated on a metrological bench oriented along the electron beam at distances of 0-400 cm from the M-30 beam output node. Diametric characteristics were determined using ionization chambers of the ROBOTRON dosimeter and a Faraday cylinder designed for diagnostics of electron beams with energies up to 30 MeV. In this work, to control the spatial uniformity of the radiation field, we used a registration method based on glass plates; the degree of uniformity of the radiation field was determined by a change in their optical characteristics, namely, the degree of darkening. For correctness of the obtained distributions, the radiation dose was limited to the region of linearity of glass darkening from the absorbed dose. The use of a radiation shaper ensured irradiation of samples with radiation of a uniform Field in the irradiation plane of 30%, which satisfies the conditions of radiation tests for most objects. Analytical dependencies of the radiation dose on the distance to the output node M-30 were obtained using a Faraday cylinder. The combination of these dose dependencies of glass darkening, the spatial homogeneity of the fields, along with the dose dependence on the distance to the source node, made it possible to develop protocols for dosimetric tracking of the irradiation process for materials and devices for various purposes. [ABSTRACT FROM AUTHOR]