Magnetic hysteresis properties of Tb-Co multilayered films.

The hysteresis properties of [Tb-Co/Ti]n and [Tb-Co/Si]n multilayered films prepared by rf-sputtering were studied. The thickness of the Tb-Co layers was varied in the interval of 3 - 200 nm. X-ray reflectivity measurements confirmed the layered structure of the samples. SQUID measurements in a wide temperature range and magneto-optical measurements at room temperature revealed the complex mechanism of the magnetization reversal of Tb-Co films, including both the processes of magnetization rotation and the movement of the domain walls. [ABSTRACT FROM AUTHOR]