Influence of Drain Bias and Flux on Heavy Ion-Induced Leakage Currents in SiC Power MOSFETs.

MLA

Peng, Chao, et al. “Influence of Drain Bias and Flux on Heavy Ion-Induced Leakage Currents in SiC Power MOSFETs.” IEEE Transactions on Nuclear Science, vol. 69, no. 5, May 2022, pp. 1037–43. EBSCOhost, https://doi.org/10.1109/TNS.2022.3166521.

APA

Peng, C., Lei, Z., Zhang, Z., Chen, Y., He, Y., Yao, B., & En, Y. (2022). Influence of Drain Bias and Flux on Heavy Ion-Induced Leakage Currents in SiC Power MOSFETs. IEEE Transactions on Nuclear Science, 69(5), 1037–1043. https://doi.org/10.1109/TNS.2022.3166521

Chicago

Peng, Chao, Zhifeng Lei, Zhangang Zhang, Yiqiang Chen, Yujuan He, Bin Yao, and Yunfei En. 2022. “Influence of Drain Bias and Flux on Heavy Ion-Induced Leakage Currents in SiC Power MOSFETs.” IEEE Transactions on Nuclear Science 69 (5): 1037–43. doi:10.1109/TNS.2022.3166521.