Effects of Shallow Carbon and Deep N++ Layer on the Radiation Hardness of IHEP-IME LGAD Sensors.

MLA

Li, Mengzhao, et al. “Effects of Shallow Carbon and Deep N++ Layer on the Radiation Hardness of IHEP-IME LGAD Sensors.” IEEE Transactions on Nuclear Science, vol. 69, no. 5, May 2022, pp. 1098–103. EBSCOhost, https://doi.org/10.1109/TNS.2022.3161048.

APA

Li, M., Fan, Y., Jia, X., Cui, H., Liang, Z., Zhao, M., Yang, T., Wu, K., Li, S., Yu, C., Liu, B., Wang, W., Yang, X., Tan, Y., Shi, X., da Costa, J. G., Heng, Y., Xu, G., Zhai, Q., & Yan, G. (2022). Effects of Shallow Carbon and Deep N++ Layer on the Radiation Hardness of IHEP-IME LGAD Sensors. IEEE Transactions on Nuclear Science, 69(5), 1098–1103. https://doi.org/10.1109/TNS.2022.3161048

Chicago

Li, Mengzhao, Yunyun Fan, Xuewei Jia, Han Cui, Zhijun Liang, Mei Zhao, Tao Yang, et al. 2022. “Effects of Shallow Carbon and Deep N++ Layer on the Radiation Hardness of IHEP-IME LGAD Sensors.” IEEE Transactions on Nuclear Science 69 (5): 1098–1103. doi:10.1109/TNS.2022.3161048.