Structural, dielectric, ferroelectric and electrical behavior of (Bi0.5Ba0.25Sr0.25)(Ti0.25Mn0.25Fe0.5)O3.

The Rietveld refined X-ray diffraction pattern of (Bi0.5Ba0.25Sr0.25)(Ti0.25Mn0.25Fe0.5)O3 sample synthesized through the high temperature mixed oxide solid state route confirms the tetragonal (space group: P4mm) symmetry. The scanning electron micrographs clearly explain the morphology of the sample. Temperature and frequency dependent dielectric parameters as well as the PE-hysteresis loop explain the validity of Curie Weiss law and ferroelectricity present in the material below the TC. The non-Debye type of relaxation, effect of grain and grain boundary on impedance is illuminated by the impedance analysis. The Field-leakage current (JE) characteristics revealed the space charge limited and Ohmic-type conduction process occurring in the material. [ABSTRACT FROM AUTHOR]