Impact of the structure on the thermal burnout effect induced by microwave pulses of PIN limiter diodes.

MLA

Zhao, Jingtao, et al. “Impact of the Structure on the Thermal Burnout Effect Induced by Microwave Pulses of PIN Limiter Diodes.” Scientific Reports, vol. 12, no. 1, Feb. 2022, pp. 1–8. EBSCOhost, https://doi.org/10.1038/s41598-022-07326-w.

APA

Zhao, J., Chen, Q., Chen, Z., Chen, C., Zhao, Z., Liu, Z., & Zhao, G. (2022). Impact of the structure on the thermal burnout effect induced by microwave pulses of PIN limiter diodes. Scientific Reports, 12(1), 1–8. https://doi.org/10.1038/s41598-022-07326-w

Chicago

Zhao, Jingtao, Quanyou Chen, Zhidong Chen, Chaoyang Chen, Zhenguo Zhao, Zhong Liu, and Gang Zhao. 2022. “Impact of the Structure on the Thermal Burnout Effect Induced by Microwave Pulses of PIN Limiter Diodes.” Scientific Reports 12 (1): 1–8. doi:10.1038/s41598-022-07326-w.