Crystal growth of La2Hf2O7 by micro-pulling-down method using W crucible.

• La 2 Hf 2 O 7 crystals (m.p.: 2418 °C) were grown by the µ-PD method using a W crucible. • The La 2 Hf 2 O 7 grown at a rate of 2.00 mm/min had some cracks. • The La 2 Hf 2 O 7 grown at a rate of 0.07 mm/min was transparent without any cracks. • The LHO[0.07 mm/min] had a transmittance of over 70% in the range of 450–800 nm. • The XRC of the LHO[0.07 mm/min] showed a sharp peak with a FWHM of 138 arcsec. La 2 Hf 2 O 7 crystals with a melting point of ∼2418 °C were grown by the micro-pulling-down method using a W crucible and deoxygenated ZrO 2 insulators. A La 2 Hf 2 O 7 crystal grown at a rate of 0.07 mm/min (LHO[0.07 mm/min]) showed a high transparency without any visible cracks and inclusions, while a La 2 Hf 2 O 7 crystal grown at a rate of 2.00 mm/min had some cracks. The LHO[0.07 mm/min] crystal had a transmittance of over 70% in the wavelength range of 450–800 nm. The X-ray rocking curve of the LHO[0.07 mm/min] crystal showed a symmetric sharp peak with a full width at half maximum of 138 arcsec. The Laue image revealed that the grown crystals were single crystals. [ABSTRACT FROM AUTHOR]