Cite
Using photoelectron spectroscopy to measure resonant inelastic X‐ray scattering: a computational investigation.
MLA
Higley, Daniel J., et al. “Using Photoelectron Spectroscopy to Measure Resonant Inelastic X‐ray Scattering: A Computational Investigation.” Journal of Synchrotron Radiation, vol. 29, no. 1, Jan. 2022, pp. 202–13. EBSCOhost, https://doi.org/10.1107/S1600577521011917.
APA
Higley, D. J., Ogasawara, H., Zohar, S., & Dakovski, G. L. (2022). Using photoelectron spectroscopy to measure resonant inelastic X‐ray scattering: a computational investigation. Journal of Synchrotron Radiation, 29(1), 202–213. https://doi.org/10.1107/S1600577521011917
Chicago
Higley, Daniel J., Hirohito Ogasawara, Sioan Zohar, and Georgi L. Dakovski. 2022. “Using Photoelectron Spectroscopy to Measure Resonant Inelastic X‐ray Scattering: A Computational Investigation.” Journal of Synchrotron Radiation 29 (1): 202–13. doi:10.1107/S1600577521011917.