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Atomic-scale fatigue mechanism of ferroelectric tunnel junctions.

Authors :
Yihao Yang
Ming Wu
Xingwen Zheng
Chunyan Zheng
Jibo Xu
Zhiyu Xu
Xiaofei Li
Xiaojie Lou
Di Wu
Xiaohui Liu
Pennycook, Stephen J.
Zheng Wen
Source :
Science Advances. 11/26/2021, Vol. 7 Issue 48, p1-10. 10p.
Publication Year :
2021

Abstract

The article presents a study that explores the atomic-scale fatigue mechanism of ferroelectric tunnel junctions. It mentions about the atomic-scale fatigue mechanism of ultrathin ferroelectric barriers associated with the aggregation of charged defects, facilitating the design of reliable ferroelectric tunnel junctions and ferroelectric nanoelectronic devices for practical applications.

Details

Language :
English
ISSN :
23752548
Volume :
7
Issue :
48
Database :
Academic Search Index
Journal :
Science Advances
Publication Type :
Academic Journal
Accession number :
153922731
Full Text :
https://doi.org/10.1126/sciadv.abh2716