Back to Search Start Over

75 nm Gate Length PHEMT With f max = 800 GHz Using Asymmetric Gate Recess: RF and Noise Investigation.

Authors :
Samnouni, M.
Wichmann, N.
Wallart, X.
Coinon, C.
Lepilliet, S.
Bollaert, S.
Source :
IEEE Transactions on Electron Devices. Sep2021, Vol. 68 Issue 9, p4289-4295. 7p.
Publication Year :
2021

Abstract

We report a high maximum frequency of oscillation (${f} _{\text {max}}$) and a current-gain cutoff frequency (${f} _{\text {T}}$) of 800 and 260 GHz, respectively, with pseudomorphic high-electron mobility transistor (PHEMT), using an InGaAs/InAs composite channel and an asymmetric gate recess. This result was achieved with long gate length ${L} _{\text {G}} = {75}$ nm. The RF small signal equivalent circuit (SSEC) was extracted up to 110 GHz. Moreover, noise parameters extraction gives a minimum noise figure (NFmin) of 0.8 dB (with associated gain ${G} _{\text {ass}} = {16}$ dB) and 1.8 dB (with associated gain ${G} _{\text {ass}} = {11.6}$ dB) at 40 and 94 GHz, respectively. In this study, the gate leakage current was considered in the SSEC of the transistor (${g} _{\text {gf}}$ and ${g} _{\text {df}}$) and for extraction of the noise parameters. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189383
Volume :
68
Issue :
9
Database :
Academic Search Index
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
153763979
Full Text :
https://doi.org/10.1109/TED.2021.3098255