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Impact Ionization Coefficients in (Al x Ga 1- x) 0.52 In 0.48 P and Al x Ga 1- x As Lattice-Matched to GaAs.

Authors :
Lewis, Harry I. J.
Qiao, Liang
Cheong, Jeng Shiuh
Baharuddin, Aina N. A. P.
Krysa, Andrey B.
Ng, Beng Koon
Green, James E.
David, John P. R.
Source :
IEEE Transactions on Electron Devices. Aug2021, Vol. 68 Issue 8, p4045-4050. 6p.
Publication Year :
2021

Abstract

The impact ionization characteristics of (AlxGa1-x)0.52In0.48P have been studied comprehensively across the full composition range. Electron and hole impact ionization coefficients ($\alpha $ and $\beta $ , respectively) have been extracted from avalanche multiplication and excess noise data for seven different compositions and compared to those of AlxGa1-xAs. While both $\alpha $ and $\beta $ initially decrease gradually with increasing bandgap, a sharp decrease in $\beta $ occurs in (AlxGa1-x)0.52In0.48P when ${x} > 0.61$ , while $\alpha $ decreases only slightly. $\alpha $ and $\beta $ decrease minimally with further increases in ${x}$ and the breakdown voltage saturates. This behavior is broadly similar to that seen in AlxGa1-xAs, suggesting that it may be related to the details of the conduction band structure as it becomes increasingly indirect in both alloy systems. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189383
Volume :
68
Issue :
8
Database :
Academic Search Index
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
153763852
Full Text :
https://doi.org/10.1109/TED.2021.3086800