Machine Learning Regression-Based Single-Event Transient Modeling Method for Circuit-Level Simulation.

MLA

Xu, Changqing, et al. “Machine Learning Regression-Based Single-Event Transient Modeling Method for Circuit-Level Simulation.” IEEE Transactions on Electron Devices, vol. 68, no. 11, Nov. 2021, pp. 5758–64. EBSCOhost, https://doi.org/10.1109/TED.2021.3113884.

APA

Xu, C., Liu, Y., Liao, X., Cheng, J., & Yang, Y. (2021). Machine Learning Regression-Based Single-Event Transient Modeling Method for Circuit-Level Simulation. IEEE Transactions on Electron Devices, 68(11), 5758–5764. https://doi.org/10.1109/TED.2021.3113884

Chicago

Xu, Changqing, Yi Liu, Xinfang Liao, Jialiang Cheng, and Yintang Yang. 2021. “Machine Learning Regression-Based Single-Event Transient Modeling Method for Circuit-Level Simulation.” IEEE Transactions on Electron Devices 68 (11): 5758–64. doi:10.1109/TED.2021.3113884.