Back to Search Start Over

Temperature dependent structural, electrical and electronic investigation of VO2 (B) thin film.

Authors :
Kumar, Manish
Kim, Younghak
Lee, Hyun Hwi
Source :
Current Applied Physics. Oct2021, Vol. 30, p85-90. 6p.
Publication Year :
2021

Details

Language :
English
ISSN :
15671739
Volume :
30
Database :
Academic Search Index
Journal :
Current Applied Physics
Publication Type :
Academic Journal
Accession number :
153438474
Full Text :
https://doi.org/10.1016/j.cap.2021.09.011