Cite
LC-TSL: A low-cost triple-node-upset self-recovery latch design based on heterogeneous elements for 22 nm CMOS.
MLA
Huang, Zhengfeng, et al. “LC-TSL: A Low-Cost Triple-Node-Upset Self-Recovery Latch Design Based on Heterogeneous Elements for 22 Nm CMOS.” Microelectronics Journal, vol. 117, Nov. 2021, p. N.PAG. EBSCOhost, https://doi.org/10.1016/j.mejo.2021.105281.
APA
Huang, Z., Pan, S., Wang, H., Liang, H., & Ni, T. (2021). LC-TSL: A low-cost triple-node-upset self-recovery latch design based on heterogeneous elements for 22 nm CMOS. Microelectronics Journal, 117, N.PAG. https://doi.org/10.1016/j.mejo.2021.105281
Chicago
Huang, Zhengfeng, Shangjie Pan, Hao Wang, Huaguo Liang, and Tianming Ni. 2021. “LC-TSL: A Low-Cost Triple-Node-Upset Self-Recovery Latch Design Based on Heterogeneous Elements for 22 Nm CMOS.” Microelectronics Journal 117 (November): N.PAG. doi:10.1016/j.mejo.2021.105281.