Cite
Analysis of Bipolar Integrated Circuit Degradation Mechanisms Against Combined TID–DD Effects.
MLA
Ferraro, Rudy, et al. “Analysis of Bipolar Integrated Circuit Degradation Mechanisms Against Combined TID–DD Effects.” IEEE Transactions on Nuclear Science, vol. 68, no. 8, Aug. 2021, pp. 1585–93. EBSCOhost, https://doi.org/10.1109/TNS.2021.3082646.
APA
Ferraro, R., Alia, R. G., Danzeca, S., & Masi, A. (2021). Analysis of Bipolar Integrated Circuit Degradation Mechanisms Against Combined TID–DD Effects. IEEE Transactions on Nuclear Science, 68(8), 1585–1593. https://doi.org/10.1109/TNS.2021.3082646
Chicago
Ferraro, Rudy, Ruben Garcia Alia, Salvatore Danzeca, and Alessandro Masi. 2021. “Analysis of Bipolar Integrated Circuit Degradation Mechanisms Against Combined TID–DD Effects.” IEEE Transactions on Nuclear Science 68 (8): 1585–93. doi:10.1109/TNS.2021.3082646.