First in-beam application of thallium bromide semiconductor detectors to particle-induced X-ray emission.

MLA

Nogami, M., et al. “First In-Beam Application of Thallium Bromide Semiconductor Detectors to Particle-Induced X-Ray Emission.” International Journal of PIXE, vol. 29, no. 1/2, Jan. 2019, pp. 53–59. EBSCOhost, https://doi.org/10.1142/S0129083519500153.

APA

Nogami, M., Hitomi, K., Terakawa, A., & Ishii, K. (2019). First in-beam application of thallium bromide semiconductor detectors to particle-induced X-ray emission. International Journal of PIXE, 29(1/2), 53–59. https://doi.org/10.1142/S0129083519500153

Chicago

Nogami, M., K. Hitomi, A. Terakawa, and K. Ishii. 2019. “First In-Beam Application of Thallium Bromide Semiconductor Detectors to Particle-Induced X-Ray Emission.” International Journal of PIXE 29 (1/2): 53–59. doi:10.1142/S0129083519500153.