Cite
Non-destructive depth-dependent morphological characterization of ferroelectric:semiconducting polymer blend films.
MLA
Spampinato, N., et al. “Non-Destructive Depth-Dependent Morphological Characterization of Ferroelectric:Semiconducting Polymer Blend Films.” Colloid & Polymer Science, vol. 299, no. 3, Mar. 2021, pp. 551–60. EBSCOhost, https://doi.org/10.1007/s00396-020-04803-4.
APA
Spampinato, N., Pecastaings, G., Maglione, M., Hadziioannou, G., & Pavlopoulou, E. (2021). Non-destructive depth-dependent morphological characterization of ferroelectric:semiconducting polymer blend films. Colloid & Polymer Science, 299(3), 551–560. https://doi.org/10.1007/s00396-020-04803-4
Chicago
Spampinato, N., G. Pecastaings, M. Maglione, G. Hadziioannou, and E. Pavlopoulou. 2021. “Non-Destructive Depth-Dependent Morphological Characterization of Ferroelectric:Semiconducting Polymer Blend Films.” Colloid & Polymer Science 299 (3): 551–60. doi:10.1007/s00396-020-04803-4.