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The Impact of Holding Voltage of Transient Voltage Suppressor (TVS) on Signal Integrity of Microelectronics System With CMOS ICs Under System-Level ESD and EFT/Burst Tests.

Authors :
Shen, Yu-Shu
Ker, Ming-Dou
Source :
IEEE Transactions on Electron Devices. May2021, Vol. 68 Issue 5, p2152-2159. 8p.
Publication Year :
2021

Abstract

Transient voltage suppressor (TVS) has been widely used on the printed circuit board (PCB) to protect the microelectronics system against the system-level electrostatic discharge (ESD) and electrical fast transient/burst (EFT/B) events. However, the signal integrity of the system operations may be destroyed after the system-level ESD and EFT/B immunity test, if the TVS were designed with a holding voltage of lower than the operating voltage of the CMOS ICs equipped in the system. In this work, the signal integrity of microelectronics system protected by the TVS with different holding voltages was studied under the system-level ESD and EFT/B immunity test. By monitoring the transient voltage waveforms in the time domain during system-level ESD and EFT/B immunity test, the system malfunction has been found when the TVS is with a lower holding voltage. Therefore, the holding voltage of the TVS must be greater than the system operating voltage to maintain the signal integrity in the field applications. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189383
Volume :
68
Issue :
5
Database :
Academic Search Index
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
151778139
Full Text :
https://doi.org/10.1109/TED.2021.3063208