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Existence of ferroelectric resistive switching memory in MoS2/PVDF heterojunction devices.

Authors :
Liu, Wei-song
Yang, Hui
Li, Lan
Source :
Journal of Physics D: Applied Physics. 10/7/2021, Vol. 54 Issue 40, p1-6. 6p.
Publication Year :
2021

Abstract

The heterostructure device based on polyvinylidene fluoride (PVDF)/MoS2 films was succesfully prepared and showed a good hysteresis feature with a unique resistive switching perpromance, where the logarithmic Iā€“V curve looks like a butterfly. The on-off ratio for the resistive switching in the device based on PVDF/MoS2 films reaches 2.5 × 102 and the resistive switching happens at āˆ’0.9 V and āˆ’4.9 V for a half loop. The influence of the introduction of MoS2 and ferroelectric PVDF film was also studied and compared to a device based on a single film. The underlying physical mechanism for the unique resistive transition was attributed to the polarization field from the ferroelectric polymer PVDF and the S vacancies in MoS2. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00223727
Volume :
54
Issue :
40
Database :
Academic Search Index
Journal :
Journal of Physics D: Applied Physics
Publication Type :
Academic Journal
Accession number :
151681025
Full Text :
https://doi.org/10.1088/1361-6463/ac100d