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Estimation of the generalized process capability index Cpyk based on bias-corrected maximum-likelihood estimators for the generalized inverse Lindley distribution and bootstrap confidence intervals.
- Source :
-
Journal of Statistical Computation & Simulation . May2021, Vol. 91 Issue 10, p1960-1979. 20p. - Publication Year :
- 2021
-
Abstract
- In this paper, we are interested in estimating the generalized process capability index ( C p y k ) proposed by Maiti et al. [On generalizing process capability indices. Qual Technol Quant Manag. 2010;7(3):279–300], when the underlying distribution is the generalized inverse Lindley (GIL) distribution. We estimate parameters of the GIL distribution using maximum likelihood (ML), bias-corrected maximum-likelihood (BCML) and bootstrap bias-corrected maximum-likelihood (BBCML) methodologies. C p y k are obtained using proposed estimators. Bootstrap confidence intervals called standard bootstrap (SB), percentile bootstrap (PB) and bias-corrected percentile bootstrap (BCPB) 95 % are constructed based on the estimators of C p y k . We compare efficiencies of the parameter estimators and the performance of ML, BCML and BBCML based Cpyk via an extensive Monte Carlo simulation study. A simulation study is also described to compare the coverage probabilities (CP) and average lengths (AL) of SB, PB and BCPB confidence intervals for proposed C p y k . Finally, two real datasets are analysed for illustrative purposes. [ABSTRACT FROM AUTHOR]
- Subjects :
- *MONTE Carlo method
*CONFIDENCE intervals
*STATISTICAL bootstrapping
Subjects
Details
- Language :
- English
- ISSN :
- 00949655
- Volume :
- 91
- Issue :
- 10
- Database :
- Academic Search Index
- Journal :
- Journal of Statistical Computation & Simulation
- Publication Type :
- Academic Journal
- Accession number :
- 151159591
- Full Text :
- https://doi.org/10.1080/00949655.2021.1879081