Evidence of C migration in the SiO2 to the SiO2/Si interface of C-implanted structures.

MLA

Ribas, E., and R. L. Maltez. “Evidence of C Migration in the SiO2 to the SiO2/Si Interface of C-Implanted Structures.” Thin Solid Films, vol. 730, July 2021, p. N.PAG. EBSCOhost, https://doi.org/10.1016/j.tsf.2021.138702.

APA

Ribas, E., & Maltez, R. L. (2021). Evidence of C migration in the SiO2 to the SiO2/Si interface of C-implanted structures. Thin Solid Films, 730, N.PAG. https://doi.org/10.1016/j.tsf.2021.138702

Chicago

Ribas, E., and R.L. Maltez. 2021. “Evidence of C Migration in the SiO2 to the SiO2/Si Interface of C-Implanted Structures.” Thin Solid Films 730 (July): N.PAG. doi:10.1016/j.tsf.2021.138702.