Cite
Precise Measurement Methodology of nH-Level Gate Electrode Inductance Based on Calculation-Error-Free Algorithm for Unity-Gain Turn-Off Devices.
MLA
Liu, Jiapeng, et al. “Precise Measurement Methodology of NH-Level Gate Electrode Inductance Based on Calculation-Error-Free Algorithm for Unity-Gain Turn-Off Devices.” IEEE Transactions on Industrial Electronics, vol. 68, no. 8, Aug. 2021, pp. 6818–27. EBSCOhost, https://doi.org/10.1109/TIE.2020.3007089.
APA
Liu, J., Zhao, B., Zhou, W., Lyu, G., Chen, Z., Xu, C., Yu, Z., & Zeng, R. (2021). Precise Measurement Methodology of nH-Level Gate Electrode Inductance Based on Calculation-Error-Free Algorithm for Unity-Gain Turn-Off Devices. IEEE Transactions on Industrial Electronics, 68(8), 6818–6827. https://doi.org/10.1109/TIE.2020.3007089
Chicago
Liu, Jiapeng, Biao Zhao, Wenpeng Zhou, Gang Lyu, Zhengyu Chen, Chaoqun Xu, Zhanqing Yu, and Rong Zeng. 2021. “Precise Measurement Methodology of NH-Level Gate Electrode Inductance Based on Calculation-Error-Free Algorithm for Unity-Gain Turn-Off Devices.” IEEE Transactions on Industrial Electronics 68 (8): 6818–27. doi:10.1109/TIE.2020.3007089.