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Monte Carlo Applications for Partially Polarized Inverse External-Compton Scattering (MAPPIES). II. Application to the UV/Soft X-Ray Excess in Blazar Spectra.
- Source :
-
Astrophysical Journal . 3/20/2021, Vol. 910 Issue 1, p1-7. 7p. - Publication Year :
- 2021
-
Abstract
- The spectral energy distributions (SEDs) of some blazars exhibit an ultraviolet (UV) and/or soft X-ray excess that can be modeled with different radiation mechanisms. Polarization measurements of the UV/X-ray emission from blazars may provide new and unique information about the astrophysical environment of blazar jets, and could thus help to distinguish between different emission scenarios. In this paper, a new Monte Carlo code—Monte Carlo Applications for Partially Polarized Inverse External-Compton Scattering—for polarization-dependent Compton scattering is used to simulate the polarization signatures in a model where the UV/soft X-ray excess arises from the bulk Compton process. Predictions of the expected polarization signatures of Compton emission from the soft X-ray excess in the SED of AO 0235+164 and the UV excess in the SED of 3C 279 are made for upcoming and proposed polarimetry missions. [ABSTRACT FROM AUTHOR]
- Subjects :
- *SOFT X rays
*MONTE Carlo method
*SPECTRAL energy distribution
*COMPTON scattering
Subjects
Details
- Language :
- English
- ISSN :
- 0004637X
- Volume :
- 910
- Issue :
- 1
- Database :
- Academic Search Index
- Journal :
- Astrophysical Journal
- Publication Type :
- Academic Journal
- Accession number :
- 149590165
- Full Text :
- https://doi.org/10.3847/1538-4357/abe133