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p-type conduction in N–Al co-doped ZnO thin films.

Authors :
Lu, J. G.
Ye, Z. Z.
Zhuge, F.
Zeng, Y. J.
Zhao, B. H.
Zhu, L. P.
Source :
Applied Physics Letters. 10/11/2004, Vol. 85 Issue 15, p3134-3135. 2p. 1 Chart, 4 Graphs.
Publication Year :
2004

Abstract

p-type ZnO thin films have been realized by the N–Al co-doping method. Secondary ion mass spectroscopy demonstrated that the N incorporation was enhanced evidently by the presence of Al in ZnO. The lowest room-temperature resistivity was found to be 57.3 Ω cm with a Hall mobility of 0.43 cm2/V s and carrier concentration of 2.25×1017 cm-3 for the N–Al co-doped p-type ZnO film deposited on glass substrate. The results were much better than those for the N-doped p-type ZnO. Moreover, the co-doped film possesses a good crystallinity with c-axis orientation and a high transmittance (90%) in the visible region. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00036951
Volume :
85
Issue :
15
Database :
Academic Search Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
14909490
Full Text :
https://doi.org/10.1063/1.1803935