Toward a Bias-free Selection Criterion in Shear Measurement.

Sample selection is a necessary preparation for weak lensing measurement. It is well-known that selection itself may introduce bias to the measured shear signal. Using image simulation and the Fourier_Quad shear measurement pipeline, we quantify the selection bias in various commonly used selection criteria (signal-to-noise ratio, magnitude, etc.). We propose a new selection criterion defined in the power spectrum of the galaxy image. This new selection criterion has a low selection bias, and it is particularly convenient for shear measurement pipelines based on Fourier transformation. [ABSTRACT FROM AUTHOR]