Broadband permittivity measurement of dielectric materials using discontinuity in substrate integrated waveguide.

The substrate integrated waveguide (SIW) is exploited for the broadband determination of the complex dielectric permittivity of lossy material. The effective measurement frequency covers the passband of the fundamental mode in the SIW. This method is an operative technique for characterising the material in millimetre‐waves. [ABSTRACT FROM AUTHOR]