Cite
A Light-Weight Neural Network for Wafer Map Classification Based on Data Augmentation.
MLA
Tsai, Tsung-Han, and Yu-Chen Lee. “A Light-Weight Neural Network for Wafer Map Classification Based on Data Augmentation.” IEEE Transactions on Semiconductor Manufacturing, vol. 33, no. 4, Nov. 2020, pp. 663–72. EBSCOhost, https://doi.org/10.1109/TSM.2020.3013004.
APA
Tsai, T.-H., & Lee, Y.-C. (2020). A Light-Weight Neural Network for Wafer Map Classification Based on Data Augmentation. IEEE Transactions on Semiconductor Manufacturing, 33(4), 663–672. https://doi.org/10.1109/TSM.2020.3013004
Chicago
Tsai, Tsung-Han, and Yu-Chen Lee. 2020. “A Light-Weight Neural Network for Wafer Map Classification Based on Data Augmentation.” IEEE Transactions on Semiconductor Manufacturing 33 (4): 663–72. doi:10.1109/TSM.2020.3013004.