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Sizing particles on substrates: A general method for oblique incidence.

Authors :
de la Pena, J.L.
Gonzales, F.
Source :
Journal of Applied Physics. 1/1/1999, Vol. 85 Issue 1, p432. 7p. 2 Diagrams, 5 Charts, 9 Graphs.
Publication Year :
1999

Abstract

Presents information on a study which developed an experimental light-scattering method to size metallic spherical and cylindrical particles on flat substrates using obliquely incident light. Theory; Experimental procedure; Results; Conclusions.

Details

Language :
English
ISSN :
00218979
Volume :
85
Issue :
1
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
1468699