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Mitigating the Effects of Charged Particle Strikes on TES Arrays for Exotic Atom X-ray Experiments.

Authors :
Tatsuno, H.
Bennett, D. A.
Doriese, W. B.
Durkin, M. S.
Fowler, J. W.
Gard, J. D.
Hashimoto, T.
Hayakawa, R.
Hayashi, T.
Hilton, G. C.
Ichinohe, Y.
Noda, H.
O'Neil, G. C.
Okada, S.
Reintsema, C. D.
Schmidt, D. R.
Swetz, D. S.
Ullom, J. N.
Yamada, S.
Source :
Journal of Low Temperature Physics. Sep2020, Vol. 200 Issue 5/6, p247-254. 8p.
Publication Year :
2020

Abstract

Exotic atom experiments place transition-edge sensor (TES) microcalorimeter arrays in a high-energy charged particle-rich environment. When a high-energy charged particle passes through the silicon substrate of a TES array, a large amount of energy is deposited and small pulses are generated across multiple pixels in the TES array due to thermal crosstalk. We have developed analysis techniques to assess and reduce the effects of charged particle events on exotic atom X-ray measurements. Using this technique, the high-energy and low-energy components of the X-ray peaks due to pileup are eliminated, improving the energy resolution from 6.6 to 5.7 eV at 6.9 keV. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00222291
Volume :
200
Issue :
5/6
Database :
Academic Search Index
Journal :
Journal of Low Temperature Physics
Publication Type :
Academic Journal
Accession number :
145653576
Full Text :
https://doi.org/10.1007/s10909-020-02484-5