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New Ultra-Fast Sub-Terahertz Linear Scanner for Postal Security Screening.

Authors :
Shchepetilnikov, A. V.
Gusikhin, P. A.
Muravev, V. M.
Tsydynzhapov, G. E.
Nefyodov, Yu. A.
Dremin, A. A.
Kukushkin, I. V.
Source :
Journal of Infrared, Millimeter & Terahertz Waves. Jun2020, Vol. 41 Issue 6, p655-664. 10p.
Publication Year :
2020

Abstract

To meet increasingly demanding technological needs in modern security and industrial applications involving rapid close-range screening, we have developed a 100-GHz linear scanner. Having incorporated a novel approach in terahertz sensing and an advanced IMPATT-diode signal generating technique, the proposed system offers an efficient non-destructive testing (NDT) solution that is absolutely safe, fast, highly portable, and cost-effective. The test results demonstrate outstanding capability of the scanner to provide continuous, high-throughput security screening of mail. The system can perform real-time imaging with effective resolution approaching 5 mm at conveyor speeds of up to 15 m/s. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
18666892
Volume :
41
Issue :
6
Database :
Academic Search Index
Journal :
Journal of Infrared, Millimeter & Terahertz Waves
Publication Type :
Academic Journal
Accession number :
144656641
Full Text :
https://doi.org/10.1007/s10762-020-00692-4