Cite
Genome-wide association mapping of tan spot resistance in a worldwide collection of durum wheat.
MLA
Galagedara, Nelomie, et al. “Genome-Wide Association Mapping of Tan Spot Resistance in a Worldwide Collection of Durum Wheat.” Theoretical & Applied Genetics, vol. 133, no. 7, July 2020, pp. 2227–37. EBSCOhost, https://doi.org/10.1007/s00122-020-03593-1.
APA
Galagedara, N., Liu, Y., Fiedler, J., Shi, G., Chiao, S., Xu, S. S., Faris, J. D., Li, X., & Liu, Z. (2020). Genome-wide association mapping of tan spot resistance in a worldwide collection of durum wheat. Theoretical & Applied Genetics, 133(7), 2227–2237. https://doi.org/10.1007/s00122-020-03593-1
Chicago
Galagedara, Nelomie, Yuan Liu, Jason Fiedler, Gongjun Shi, Shiaoman Chiao, Steven S. Xu, Justin D. Faris, Xuehui Li, and Zhaohui Liu. 2020. “Genome-Wide Association Mapping of Tan Spot Resistance in a Worldwide Collection of Durum Wheat.” Theoretical & Applied Genetics 133 (7): 2227–37. doi:10.1007/s00122-020-03593-1.