Complementarity of Various Diffraction Techniques Applied to Characterisation of Residual Stress in a Palladium Alloy.

The residual stress (RS) profile state of a palladium alloy sample, used in dentistry applications, has been determined by various diffraction techniques. An additional aim of this work was to improve different experimental methods dedicated to such RS evaluation, demonstrating that the X-ray, neutron and high-energy synchrotron X-ray diffraction (HESXRD) techniques are complementary when employed in different zones of the sample. [ABSTRACT FROM AUTHOR]