Investigation of the anomalous hump phenomenon in amorphous InGaZnO thin-film transistors.

MLA

Teng, Tong, et al. “Investigation of the Anomalous Hump Phenomenon in Amorphous InGaZnO Thin-Film Transistors.” Solid-State Electronics, vol. 170, Aug. 2020, p. N.PAG. EBSCOhost, https://doi.org/10.1016/j.sse.2020.107814.

APA

Teng, T., Hu, C.-F., Qu, X.-P., & Wang, M. (2020). Investigation of the anomalous hump phenomenon in amorphous InGaZnO thin-film transistors. Solid-State Electronics, 170, N.PAG. https://doi.org/10.1016/j.sse.2020.107814

Chicago

Teng, Tong, Chun-Feng Hu, Xin-Ping Qu, and Mingxiang Wang. 2020. “Investigation of the Anomalous Hump Phenomenon in Amorphous InGaZnO Thin-Film Transistors.” Solid-State Electronics 170 (August): N.PAG. doi:10.1016/j.sse.2020.107814.