Magnetic Depth Profiling of the Co/C60 Interface Through Soft X-Ray Resonant Magnetic Reflectivity.

We have probed the structural and magnetic properties of a ferromagnetic/organic interface constituted by a polycrystalline Co layer deposited on a fullerene thin film through resonant soft X-ray reflectivity measurements. The fitting analysis of the reflectivity indicates the formation of a sharp interface with limited intermixing and a null remanent magnetization in a ~1 nm thick region of the Co film at the interface with C60. This information contributes to elucidate the role of organic–inorganic interfaces in the charge and spin transport inside organic spintronic devices. [ABSTRACT FROM AUTHOR]