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Preparation GaxMn1-xN DMS materials using HVPE method

Authors :
Yu, Y.Y.
Zhang, R.
Xiu, X.Q.
Xie, Z.L.
Yu, H.Q.
Shi, Y.
Shen, B.
Gu, S.L .
Zheng, Y.D.
Source :
Journal of Crystal Growth. Sep2004, Vol. 269 Issue 2-4, p270-275. 6p.
Publication Year :
2004

Abstract

Mn-doped films were grown in an ammonia-source HVPE system. Mn3GaN0.5 and GaN were detected in film samples without other phase when the HCl–Mn/NH3 ratio range from <f>1/200</f> to <f>1/100</f>. (GaxMn1-x)N phase also formed in films. Two broad bands centered at 305 and 674 cm-1and new peaks at wave numbers of 592 cm-1arised in Raman spectra of Mn-doped films. It was also found that A1(LO) modes of all Mn-doped samples were strongly asymmetric and showed a considerable redshift. Mn-doped films showed an obvious hysteresis loops at room temperature. Mn-doped films showed metallic characteristic and this mixed structure may be greatly beneficial to spin injection magnetotransport devices. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
00220248
Volume :
269
Issue :
2-4
Database :
Academic Search Index
Journal :
Journal of Crystal Growth
Publication Type :
Academic Journal
Accession number :
14188030
Full Text :
https://doi.org/10.1016/j.jcrysgro.2004.05.086