Crystal Growth of Materials with the ThCr2Si2 Structure Type.

The single crystal growth of 19 different intermetallic compounds within the LnT2X2 family (with Ln = lanthanides, T = Co, Ru, Rh, Ir, and X = Si, P) is presented, by employing a high‐temperature metal‐flux technique. The habitus of the obtained crystals is platelet‐like with the crystallographic c direction perpendicular to the surface and with individual masses between 1 and 100 mg. The magnetic properties of these crystals are characterized by magnetization, heat‐capacity, and resistivity measurements. These crystals form the materials basis for a thorough study of exciting surface properties by angle‐resolved photoemission spectroscopy. [ABSTRACT FROM AUTHOR]