Düşük Tellür Katkılı CuInGaSe2 İnce Filmlerin Yapısal Özelliklerinin İncelenmesi.

In this study, Cu(In,Ga)(Se1-yTey)2 thin films were obtained by evaporation of the bulk form compound with electron beam followed by annealing at elevated temperature. The X-ray diffraction patterns (XRD), Raman spectra, surface images and atomic concentration measurements of the samples were analyzed and compared with the structural properties of the undoped and low Te doped samples. In XRD patterns, it was observed that a phase separation such as Cu(In,Ga)Se2 and CuIn3Se5 formed in the CIGS thin film, but with the Te content, this phase separation was disappeared. Experimental values of A1 Raman modes of the samples were compared with the values obtained by a theoretical approach. It was seen that the film surface became more uniform and the particles formed in sub-micron dimensions as the Te content increase in the film. Similarly, it was observed that the composition profile in the structure improved (the amount of Ga increased) and that the targeted amount of Te almost entered the structure. [ABSTRACT FROM AUTHOR]