Cite
A CNN-Based Transfer Learning Method for Defect Classification in Semiconductor Manufacturing.
MLA
Imoto, Kazunori, et al. “A CNN-Based Transfer Learning Method for Defect Classification in Semiconductor Manufacturing.” IEEE Transactions on Semiconductor Manufacturing, vol. 32, no. 4, Nov. 2019, pp. 455–59. EBSCOhost, https://doi.org/10.1109/TSM.2019.2941752.
APA
Imoto, K., Nakai, T., Ike, T., Haruki, K., & Sato, Y. (2019). A CNN-Based Transfer Learning Method for Defect Classification in Semiconductor Manufacturing. IEEE Transactions on Semiconductor Manufacturing, 32(4), 455–459. https://doi.org/10.1109/TSM.2019.2941752
Chicago
Imoto, Kazunori, Tomohiro Nakai, Tsukasa Ike, Kosuke Haruki, and Yoshiyuki Sato. 2019. “A CNN-Based Transfer Learning Method for Defect Classification in Semiconductor Manufacturing.” IEEE Transactions on Semiconductor Manufacturing 32 (4): 455–59. doi:10.1109/TSM.2019.2941752.